Rohde & Schwarz patented a measurement device and method for testing devices under test (DUT). The device includes an input terminal, A/D converter, filter, detector, and controller to adjust IFBW and sample number based on SNR values to meet measurement criteria. GlobalData’s report on Rohde & Schwarz gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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According to GlobalData’s company profile on Rohde & Schwarz, Wireless network optimization was a key innovation area identified from patents. Rohde & Schwarz's grant share as of April 2024 was 54%. Grant share is based on the ratio of number of grants to total number of patents.
Measurement device for testing dut, adjusting ifbw and samples
A recently granted patent (Publication Number: US11953543B2) discloses a measurement device designed for testing devices under test (DUT). The device includes an input terminal for receiving RF signals from the DUT, analog-to-digital converters to generate digital data signals, filters to adjust the signals based on intermediate-frequency bandwidth, a detector for analysis, and a controller to calculate signal-to-noise ratio (SNR) values. The controller can adjust the filter settings and number of samples based on the calculated SNR to meet predetermined measurement criteria, ensuring accurate testing results.
Furthermore, the patent includes a method for operating the measurement device and a computer-readable recording medium storing instructions for executing the method. The method involves receiving RF signals, generating digital data, filtering and analyzing the data, calculating SNR values, and adjusting filter settings and sample numbers to meet measurement criteria. The device can be used with various types of analyzers, such as vector network analyzers, spectrum analyzers, and communication analyzers, making it versatile for different testing requirements. Overall, the patent highlights a sophisticated measurement device and method that can enhance the accuracy and efficiency of testing processes for a wide range of devices under test.
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